Home >                  	Term: secondary ion mass spectrometry (SIMS)  
secondary ion mass spectrometry (SIMS)
A precision measurement technique used to quantitatively analyze the elements and isotopes of materials at microscopic scales (with a typical spatial resolution of 1 micrometer). A SIMS instrument is also called an ion microprobe.
- Part of Speech: noun
- Industry/Domain: Astronomy
- Category: Planetary science
- Company: PSRD
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 Creator
- kathy.tucson
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